On March 26, 2013, the 2013 Xi'an Power Device Testing and Application Center hosted by Xi'an Semipower Electronic Technology Co., Ltd., Xi'an Science and Technology Market, Xi'an Integrated Circuit Industry Development Center, and Xi'an High-tech Enterprise Association discussed high-reliability power devices and systems. The seminar on testing and application technology was officially launched. Relevant leaders and guest representatives of Xi'an City delivered opening speeches. Nearly a hundred guests and peers attended the launching ceremony.
The seminar lasted for three days, including keynote speeches, laboratory field visits, group discussions with manufacturer guest representatives, and school lectures. The rich and exciting content arrangement made the guests from afar feel that the trip was worthwhile and they had benefited a lot. .
Guests attending the launching ceremony (from right to left): German PVA application expert Mr. Kasim Altin, American ITC Technology Development Director Mr. David J. Lohr, Xi'an Integrated Circuit Industry and Exhibition Center Director He Xiaoning, Xi'an High-tech Zone Management Committee Development Mr. Jia Qiang, Director of the Reform and Commerce Bureau, Mr. Gao Jiping, Deputy Director of Xi'an Science and Technology Bureau, Mr. Zhang Weiguo, Director of Xi'an Science and Technology Market, Mr. Luo Yi of Xi'an Semipower Electronic Technology Co., Ltd., and Ms. Liu Chen, Director of Xi'an Semiconductor Power Device Testing and Application Center
In order to fully realize the platform role of the test application center and allow guests to understand the latest industry trends and industry information, the organizer of this seminar specially invited industry experts and management executives from well-known domestic and foreign companies to discuss the development of semiconductor power device testing technology. and conduct in-depth exchanges and discussions on related topics such as technology applications and system solutions. The atmosphere at the keynote speech was lively and the discussion was lively. The guests actively asked questions and interacted with the speeches of the guests. The speakers gave comprehensive answers one by one, which fully promoted the communication between the enterprise and upstream and downstream companies. The experts' wonderful speeches ended successfully with warm applause.
Since the establishment of Xi'an Power Device Testing and Application Center, it has received many visits from experts in the same industry and students from relevant majors in cooperative universities, and has been unanimously recognized by experts and schools. Guests from inside and outside the province who participated in this seminar are also looking forward to the testing center.
On March 27, under the leadership of Mr. Luo Yi, General Manager of Xi'an Semipower and Ms. Liu Chen of the Testing and Application Center, the guests visited the Testing and Application Center. Ms. Liu Chen, the laboratory director, introduced the laboratory equipment one by one. The visiting guests focused on Some of the center's new equipment raised technical questions, and equipment experts answered the questions one by one and discussed new technologies for power device testing with the guests. After the visit, the guests expressed their affirmation of the laboratory's construction results and were confident in its future development.
After the visit to the Test Application Center and technical exchanges on the morning of March 27, in the afternoon of March 27, guests and peers held group discussions in a relaxed and warm atmosphere, focusing on device testing, failure analysis, system testing and reliability. Sexual experiments were discussed in depth.
The device test discussion group was attended by technicians from the Test Application Center, colleagues in the semiconductor industry, and Mr. Dave, the technical director of ITC. Everyone was very interested in the actual test of dynamic equipment based on ITC57300, especially the MOSFET reverse recovery test project, and put forward their opinions one after another, which were resolved during the discussion. How to improve the di/dt test condition settings by adjusting related settings (VDD, Lload, Pusle Duration, Vg) to meet customers' extreme performance testing in the research and development stage, and at the same time greatly expand the testing capabilities of the device testing laboratory.
During the discussion, Fairchild senior test engineer Mr. Edward and ITC technical director Mr. Dave discussed the standard method of testing the diode Peak dv/dt project in MIL-STD-750F, circuit construction, and the specific implementation of the method with existing laboratory equipment. A lively discussion was held on the problem, and the implementation plan of the test module + Labview soft control architecture was discussed. In the failure analysis discussion group, Mr. Kasim Altin from the internationally renowned ultrasonic scanning equipment supplier PVA Company used a combination of live demonstrations and theoretical explanations to attract practical problems in applications raised by various power supply companies, universities, and packaging manufacturers. Attention of many technicians. Mr. Kasim Altin’s non-destructive ultrasonic testing of metal special packaging products of a large electronics company solved the problem that had troubled the company for many years in controlling defects through non-destructive testing in such metal packaging products. The engineers of the system testing team also conducted targeted technical exchanges with industry experts. Among them, Mr. Zhu Peng, the system laboratory director, and Ms. Shen Jie, the system laboratory application engineer, discussed and discussed with the American HALT/HASS application expert Mr. Walter Wu. Technical issues such as the design of the fixture in the HALT/HASS experiment and the design differences between the circuit board-level fixture and the power system-level fixture were initially determined. At the same time, the technical staff of the test center also discussed with Mr. Yu Minghao, an engineer at the Xi'an Application Center of International Rectifier (IR), on the new trends, new problems, and new technologies emerging in power device applications in client applications.
Regarding reliability experiments, the engineers of the Test Application Center and Mr. Xu Zhongliang, the sales general manager of Guofuqi China, as well as research institutions and manufacturers such as the Fourth Institute of the Ministry of Industry and Information Technology and the Thirteenth Institute of Electronics, have discussed the development, latest technology, and practice of reliability environmental test standards. Various problems encountered were discussed and exchanged, especially good suggestions were made for the selection and optimization of different modes of high and low temperature impact tests. Mr. Xu pointed out that the time optimization mode saves energy while ensuring the effectiveness of the test; normal mode is the most common mode based on time; time optimization mode is a mode designed to start timing when the temperature reaches relevant requirements when the temperature rise rate becomes smaller when the test sample is larger. Corresponding modes can be selected for different testing requirements, which has great guiding significance for the industry in evaluating product quality and designing reliability tests.
One of the concepts upheld by the Xi'an Power Device Testing and Application Center is to provide as much assistance and support as possible to future semiconductor industry practitioners on campus. Since its establishment, the testing center has held dozens of special lectures in the school, creating a new generation in Xi'an universities. had a wide impact.
In view of the current situation that college students have rich theoretical knowledge but insufficient practical ability, invited by Xi'an University of Electronic Science and Technology, Northwestern Polytechnical University and Chang'an University, from March 28 to 29, Mr. David J. Lohr, Technical Director of ITC in the United States, and Fuchs Xu from Germany Mr. Zhongliang and Mr. Kasim Altin, senior application engineer of German PVA, went to the university and gave five special speeches on the application of power cycling, intermittent life testing, power device reliability environmental testing, and the latest development of ultrasonic imaging and analysis technology for semiconductor device applications. , a series of lectures starting from the use of test equipment and analysis of test data, focusing on the combination of test theory and the latest technology, and carrying out multi-faceted education for students in related majors. Mr. David quoted typical test curves, gave detailed explanations and incisive analysis to the students, and answered questions raised by the students, allowing the students to truly feel the importance of combining theory and practice.
The lecture series was welcomed and highly praised by college students, teachers and professional audiences, and the lecture classroom was packed with seats. The students were very active in the questioning and discussion sessions. They all said that they had benefited a lot from this lecture and were full of expectations for the next special lecture.
