In December 2017, in order to achieve a more stringent pursuit of product quality, meet customers' high reliability requirements for products, improve automotive-grade product certification test projects, and expand testing capabilities, after multiple rounds of evaluation and comparison, the Test Application Center Reliability Experiment The office purchased 2 sets of DEVR-V high temperature reverse bias aging systems from Hangzhou Reliability Instrument Factory.
The high-temperature reverse bias aging system can monitor the leakage current of aging devices in real time, with a measurement range of 1.0uA–30mA. It has over-temperature and over-voltage alarm protection functions. Comply with HTRB&HTGB test requirements of MIL-STD-750, GJB, JEDEC, AECQ101 and other standards. This equipment triples the high-temperature aging test capabilities of the reliability laboratory and enables HTRB experiments on depletion-mode devices.
