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Shi Kangdu, Deputy Director of Xi'an High-Tech Development Zone, Went to Chippower for Investigation

On September 19, Shi Kangdu, deputy director of Xi'an High-tech Development Zone, was invited to Semipower for investigation.


Semipower President Mr. Luo Yi and Deputy General Manager Ms. Li Linfei accompanied Deputy Director Shi Kangdu to visit the Test Application Center. Mr. Luo Yi introduced the leading test equipment of the Test Application Center and explained in detail the rigorous testing experiments and analysis from chips to power products. The test process of the test application center was introduced, and the development history and future development direction and planning of the test application center were introduced. Deputy Director Shi Kandu spoke highly of the Test Application Center's efforts in actively introducing advanced testing equipment and technical experience from abroad, while cooperating with universities to cultivate high-end semiconductor professionals, and was confident in the development of Semipower in the field of IGBT testing and automotive electronics. , and hopes that the test application center will continue to develop and expand and achieve greater breakthroughs in promoting cross-border development of independent innovation.


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