On November 16, the "Testing and Guarantee of High Reliability Power Devices and Systems" seminar was held in Shangri-La, Xi'an. Famous international and domestic semiconductor companies, semiconductor industry associations, and industry experts gathered together to explore the endless world of power devices. Mystery. At the meeting, the Xi'an Semiconductor Power Device Application Test Center, jointly built by Xi'an Pioneer Park and Xi'an Semipower Electronic Technology Co., Ltd., was officially unveiled.
This seminar was jointly organized by Xi'an High-tech Zone Pioneer Park Development Center and Xi'an Semipower Electronics Co., Ltd. Song Minsheng, deputy director of the Shaanxi Provincial Department of Commerce, Chen Xian, secretary-general of the China Semiconductor Industry Association, and Wu Haichao, deputy director of the Xi'an Science and Technology Bureau attended the ceremony.
At the seminar, well-known experts in the industry such as Bran-don Bailey, President of STI, and David J. Lohr, Technical Development Director of ITC, shared with the participants the development of semiconductor power device testing technology and the new semiconductor power device testing industry. .
Xi'an Power Device Testing and Application Center is an open laboratory that provides R&D testing and analysis for semiconductor power devices and power ICs. It is jointly built by Xi'an Pioneer Park and Xi'an Semipower Electronic Technology Co., Ltd. The test center consists of application/system testing, reliability laboratory, device testing, and failure analysis laboratory. Through product testing, system testing, performance research, reliability experiments, failure analysis and other technical means, we provide complete design and development verification, production quality monitoring, product certification, finished product testing, application testing and Customer technical support and other comprehensive services.
At present, Xi'an Semiconductor Power Device Application Testing Center has established various cooperative relationships with many well-known domestic universities, such as cooperative laboratories, public service platforms for college student internships, and targeted joint training of personnel. It has formed multi-faceted cooperative relationships with multiple research institutions, upstream and downstream manufacturing companies, and has now become a partner of Global Sources, the US Qualmark/STI/ITC Collaborative Laboratory, China Power Supply Society and other world-renowned commercial institutions and domestic academic institutions. designated test application laboratory.
Deputy Director of Shaanxi Provincial Department of Commerce: Song Minsheng
Director of the Planning Department of Shaanxi Provincial Development and Reform Commission: Wen Zhigang
Shaanxi Provincial Department of Industry and Information Technology Solar Photovoltaic Industry Division, Deputy Director and Director of the Provincial Photovoltaic Office: Ren Junen
Director of Xi’an Science and Technology Bureau: Ask Xiangrong
Director of the Electronic Information and Software Service Industry Division of Xi'an Industry and Information Technology Commission: Xue Tieying
Vice President of STI USA: Brandon Bailey
Technical Development Director of American ITC Company: Dave Lohr
President of KYDD CONSULTING, USA: Douglas Lamond
President of Qualmark USA: Andy Drenick
General Manager of Shaoxing Hongbang Electronic Technology Co., Ltd.: He Jifa
Secretary General of China Semiconductor Association: Chen Xian
Director of the Enterprise Recognition Office of China Semiconductor Industry Association: Zhang Shengwen
In addition, there are heads of eight high-efficiency microelectronics colleges in Xi'an, including Xi'an Jiaotong University, Northwestern Polytechnical University, and Xi'an University of Electronic Science and Technology.
The opening ceremony of Xi'an Semiconductor Power Device Application Test Center will be held at the same time. It is a specialized organization that provides companies in the semiconductor industry with services ranging from chip testing to system aging and failure analysis. The test scope includes 4', 6', and 8' wafer parameter testing, power device parameter testing, electronic component reliability testing, electronic component failure analysis, as well as switching power supply functional testing, aging experiments, conducted radiation interference, and static electricity Discharge, lightning surge and safety inspection, etc.
The test center has more than 100 advanced facilities and equipment, many of which are the first to be used in the northwest region. Reliability testing equipment such as the American Qualmark vibration table and the German Fuchs new high and low temperature shock chamber are the first to be used in the semiconductor industry.
